University of Sydney researchers have made a significant discovery for the first time providing a full picture of how fatigue in ferroelectric materials occurs.
Ferroelectric fatigue is a major cause of failure in a range of electronic devices. Discarded electronics are a major contributor to e-waste. Globally, tens of millions of tons of failed electronic devices end up in landfills each year.
Dr Qianwei Huang, a research associate in the School of Aerospace, Mechanical and Mechatronic Engineering at the University of Sydney, told SBS Chinese: "We hope (this research) will be helpful to both industry and the environment."
Please see the report in Chinese.